Our Tech | Photo electron Soul Inc.

Video Release: Advanced Applications in Semiconductor Inspection and Metrology with Our Proprietary Technology

2026-04-30

Announcement of an Invited Talk: OPTICS & PHOTONICS International Congress 2026 (OPIC 2026)

2026-03-18

Invited Talk Information: The 73rd Spring Meeting of the Japan Society of Applied Physics

2026-02-04

Announcement of Conference Presentations: SPIE Advanced Lithography + Patterning 2026

2026-01-19

Our Technologies Featured in Photonics Spectra

2026-01-16

Speaking Engagement: SEMICON JAPAN, Metrology & Inspection Summit 2025 (Tokyo, Japan)

2025-10-31

Announcement: Presentation at The 45th Annual NANO Testing Symposium (Osaka, Japan)

2025-09-24

“Invited Talk at the 12th Symposium of the Advanced Power Semiconductors” An invited talk will be delivered as follows at the 12th Symposium of the Advanced Power Semiconductors.

2025-07-30

Latest progress on “Charge-reduced SEM imaging” will be presented at The 81st Annual Meeting of The Japanese Society of Microscopy.

2025-05-30