Invited Talk Information：The 33rd Power & Analog Device Analysis Workshop

Photo electron Soul Inc. will give an invited talk at The 33rd Power & Analog Device Analysis Workshop, to be held in Tokyo, Japan.

In this presentation, we will introduce our proprietary non-contact inspection and metrology technology for MOSFETs using GaN semiconductor photocathodes. We will also highlight its potential to contribute beyond inspection and metrology to semiconductor analysis.

■ Conference Information
•Conference:The 33rd Power & Analog Device Analysis Workshop
•Dates: September 11, 2026
•Venue: KFC Hall, Kokusai Fashion Center, Tokyo, Japan

■ Presentation Information
•Date & Time: September 11, 2026, 13:00 – 17:00
•Title: Non-contact inspection and measurement technology for MOSFETs using GaN semiconductor photocathodes
•Speaker: Daiki Sato (Photo electron Soul Inc.)