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Joint Research Team Wins “Best Interested Paper Award” at the 45th Nano Testing Symposium (NANOTS 2025)
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Announcement of Conference Presentations: SPIE Advanced Lithography + Patterning 2026
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Our Technologies Featured in Photonics Spectra
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Speaking Engagement: SEMICON JAPAN, Metrology & Inspection Summit 2025 (Tokyo, Japan)
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Announcement: Presentation at The 45th Annual NANO Testing Symposium (Osaka, Japan)
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GaN-based e-Beam Inspection and Metrology Co-developed by Startup Photo electron Soul Inc. and Nagoya University Will be Evaluated by KIOXIA, a Leading NAND Flash Memory Producer
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“Invited Talk at the 12th Symposium of the Advanced Power Semiconductors” An invited talk will be delivered as follows at the 12th Symposium of the Advanced Power Semiconductors.
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