We are pleased to announce that our company will deliver an invited talk at the OPTICS & PHOTONICS International Congress 2026 (OPIC 2026), to be held at Pacifico Yokohama from April 20 to 24, 2026.
The invited talk will present innovative inspection and metrology technologies for semiconductor manufacturing based on GaN photocathodes.
OPIC is one of the largest international academic conferences in Japan, bringing together cutting-edge research in optics and laser technologies.
This invited talk will be presented at LEDIA 2026, a specialized conference within OPIC 2026 that focuses on next-generation light-emitting devices and their industrial applications. The presentation has been selected as a highlighted contribution addressing key enabling technologies in this field.
■ Conference Overview
• Conference Name: OPTICS & PHOTONICS International Congress 2026
• Dates: April 20 (Mon) – April 24 (Fri), 2026
• Venue: Pacifico Yokohama Conference Center
■ Invited Talk Details
• Date & Time: April 21 (Tue), 2026, 15:00–15:30
• Title: GaN Photoemission-Based Electron Beam Devices Enabling Innovative Metrology and Inspection in Semiconductor Manufacturing
• Presenter: Tomohiro Nishitani (Photo electron Soul, Inc.)
• Notes: Presented as part of the 11th International Conference on Light Emitting Devices and Their Industrial Applications (LEDIA 2026)