We are pleased to announce that our advanced measurement technology has been featured in Photonics Spectra,
a leading global magazine dedicated to optics and photonics, as part of its semiconductor metrology special coverage.
The article highlights insights from our CTO, Tomohiro Nishitani, who discusses the future of next-generation metrology technologies.
It also covers a detailed overview of our recent technological breakthroughs.
We encourage you to read the full article to learn more about our innovations and vision. Click the link below.
