2025 | Photo electron Soul Inc.

Announcement: Presentation at The 45th Annual NANO Testing Symposium (Osaka, Japan)

2025-09-24

GaN-based e-Beam Inspection and Metrology Co-developed by Startup Photo electron Soul Inc. and Nagoya University Will be Evaluated by KIOXIA, a Leading NAND Flash Memory Producer

2025-09-02

“Invited Talk at the 12th Symposium of the Advanced Power Semiconductors” An invited talk will be delivered as follows at the 12th Symposium of the Advanced Power Semiconductors.

2025-07-30

Latest progress on “Charge-reduced SEM imaging” will be presented at The 81st Annual Meeting of The Japanese Society of Microscopy.

2025-05-30

The following latest technologies will be presented ‘SPIE Advanced Lithography + Patterning’ in the United States.

2025-01-30