Information GaN-based e-Beam Inspection and Metrology Co-developed by Startup Photo electron Soul Inc. and Nagoya University Will be Evaluated by KIOXIA, a Leading NAND Flash Memory Producer 2025-09-02
Our Tech “Invited Talk at the 12th Symposium of the Advanced Power Semiconductors” An invited talk will be delivered as follows at the 12th Symposium of the Advanced Power Semiconductors. 2025-07-30
Our Tech Latest progress on “Charge-reduced SEM imaging” will be presented at The 81st Annual Meeting of The Japanese Society of Microscopy. 2025-05-30
Our Tech The following latest technologies will be presented ‘SPIE Advanced Lithography + Patterning’ in the United States. 2025-01-30
