当社技術に関する論文３編が『Journal of Vacuum Science &Technology』に掲載されました。
Scanning electron microscope imaging by selective e-beaming using photoelectron beams from semiconductor photocathodes
Tomohiro Nishitani, Yuta Arakawa, Shotaro Noda, Atsushi Koizumi, Daiki Sato, Haruka Shikano, Hokuto Iijima, Yoshio Honda, and Hiroshi Amano, Journal of Vacuum Science & Technology B 40, 064203 (2022)
https://doi.org/10.1116/6.0002111
Time response measurement of pulsed electron beam from InGaN photocathode
Daiki Sato, Haruka Shikano, Atsushi Koizumi, and Tomohiro Nishitani, Journal of Vacuum Science & Technology B 40, 064204 (2022)
https://doi.org/10.1116/6.0002122
Dependence of electron emission current density on excitation power density from Cs/O-activated negative electron affinity InGaN photocathode
Atsushi Koizumi, Daiki Sato, Haruka Shikano, Hokuto Iijima, and Tomohiro Nishitani, Journal of Vacuum Science & Technology B 40, 062202 (2022)
https://doi.org/10.1116/6.0002124